Todd W. Welch

Todd W. Welch, Diplomate of the American Board of Forensic Document Examiners, is a forensic document examination expert specializing in fraud detection and counterfeit document analysis. With a career spanning forensic science, law enforcement, and specialized training with agencies such as the USSS and FBI, he brings a comprehensive forensic framework to litigation work. His work centers on investigating document authenticity, assessing handwriting and ink analysis, and evaluating whether document alterations have occurred.

Mr. Welch has been retained in numerous expert witness and consulting engagements across the United States, involving cases of document fraud, trace evidence analysis, and counterfeit detection. His Bachelor of Arts in Criminal Justice, along with his certification as a Diplomate of the American Board of Forensic Document Examiners, reinforce his ability to deliver objective, defensible analyses. He is regularly engaged by both plaintiff and defense counsel to provide clear, independent determinations of authenticity and responsibility in disputes involving questioned documents and forensic evidence.